Blank Cover Image

New surface photovoltage (SPV) method for high precision measurement of the minority carrier diffusion length and surface recombination velocity in silicon wafers

著者名:
Faifer, V.
Edelman, P.
Kontkiewicz, A.
Lagowski, J.
Hoff, A.
Dyukov, V.
Pravdivtsev, A.
Kornienko, I.
さらに 3 件
掲載資料名:
ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
95-30
発行年:
1995
開始ページ:
73
終了ページ:
82
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771221 [1566771226]
言語:
英語
請求記号:
E23400/961027
資料種別:
国際会議録

類似資料:

Lagowski, J., Faifer, V., Edelman, P.

Electrochemical Society

Tan,L.S., Koh,S.H., Prakash,S., Choi,W.K., Zhang,Z.

SPIE - The International Society for Optical Engineering

Kontkiewicz, A. M., Lagowski, J., Dexter, M., Edelman, P.

MRS - Materials Research Society

Lagowski, Jacek, Edelman,. Piotr, Dexter, Mark

Materials Research Society

Lagowski, J., Edelman, P.

Electrochemical Society

Lagowski, Jacek, Morawski, Adrzej, Edelman, Piotr

Materials Research Society

Edelman,. Piotr, Lagowski, Jacek, Jastrzebski, Lubek

Materials Research Society

Ma,Y., Lee,J.L., Benton,J.L., Boone,T., Eaglesham,D.J., Higashi,G.S.

SPIE-The International Society for Optical Engineering

Lagowski, J., Hoff, A., Jastrzebski, L., Edelman, P., Esry, T.

MRS - Materials Research Society

Edelman, P., Lagowski, J., Savchouk, A., Hoff, A., Jastrzebski, L., Persson, E.

MRS - Materials Research Society

M. Wilson, A. Savtchouk, I. Tasarov, J. D'Amico, P. Edelman

Electrochemical Society

Arndt, W., Graff, K., Heim, P.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12