Blank Cover Image

A SURFACE NORMAL MEASUREMENT OF CVD DIAMOND PARTICLES BY ATOMIC FORCE MICROSCOPY

著者名:
掲載資料名:
Proceedings of the Fourth International Symposium on Diamond Materials
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
95-4
発行年:
1995
開始ページ:
693
終了ページ:
698
総ページ数:
6
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566770989 [156677098X]
言語:
英語
請求記号:
E23400/952064
資料種別:
国際会議録

類似資料:

Blach, J.A., Watson, G.S., Brown, C.L., Pham, D.K., Wright, J.P., Nicolau, D.V., Myhra, S.

SPIE-The International Society for Optical Engineering

Occelli, M. L., Gould, S. A. C., Stucky, G. D.

Elsevier

Kump,K.S., Sachs,P.B., Wilson,D.L.

SPIE-The International Society for Optical Engineering

Watson G. S, Brown C. L, Myhra S., Roch N. C, Hu S., Watson J. A

SPIE - The International Society of Optical Engineering

Wang, Y., Angus, J.C.

Electrochemical Society

Bo, Xiang-Zheng, Rokhinson, Leonid P., Yin, Haizhou, Tsui, D.C., Sturm, J.C.

Materials Research Society

Crozier,K.B., Yaralioglu,G.G., Degertekin,F.L., Adams,J.D., Minne,S.C., Quate,C.F.

SPIE-The International Society for Optical Engineering

Blach, J.A., Watson, G.S., Brown, C.L., Suzuki, T., Myhra, S.

SPIE-The International Society for Optical Engineering

Sanchez, G., Polo, M. C., Wang, W. L., Esteve, J.

MRS - Materials Research Society

Jungnickel, G., Porezag, D., Frauenheim, Th., Lambrecht, W. R. L., Segall, B., Angus, J. C.

Materials Research Society

Ravi, K.V., Oden, P.I., Yaniv, D.

Electrochemical Society

Angus C. J., Wang Y.

Plenum Press

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12