DEPTH-RESOLVED RESIDUAL STRESS MEASUREMENTS IN HOMOEPITAXIAL DIAMOND FILMS GROWN BY CHEMICAL VAPOR DEPOSmON
- 著者名:
- 掲載資料名:
- Proceedings of the Fourth International Symposium on Diamond Materials
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 95-4
- 発行年:
- 1995
- 開始ページ:
- 443
- 終了ページ:
- 448
- 総ページ数:
- 6
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566770989 [156677098X]
- 言語:
- 英語
- 請求記号:
- E23400/952064
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
Electrochemical Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Materials Research Society |
Materials Research Society |
11
国際会議録
The Effect of Deposition Conditions on the Properties of Vapor-Deposited Parylene AF-4 Films
MRS - Materials Research Society |
Materials Research Society |