Neural network tracking and extension of positive tracking periods

Neural network tracking and extension of positive tracking periods

著者名:

Hanan, J.C. ( Jet Propulsion Lab. (USA) )
Chao, T.-H. ( Jet Propulsion Lab. (USA) )
Moreels, P. ( California Institute of Technology (USA) )

掲載資料名:

Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5437

発行年:

2004

開始ページ:

233

終了ページ:

237

総ページ数:

5

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453600 [0819453609]

言語:

英語

請求記号:

P63600/5437

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013789
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Optical Pattern Recognition
回次:	2004 : 15th
会議開催地:	Oriando, FL, USA
会議開催年:	2004.04.15-2004.04.16

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