Modeling feature uncertainty in the Bayesian data reduction algorithm

Modeling feature uncertainty in the Bayesian data reduction algorithm

著者名:

Lynch, R.S., Jr. ( Naval Undersea Warfare Ctr. (USA) )
Willett, P.K. ( Univ. of Connecticut (USA) )

掲載資料名:

Signal processing, sensor fusion, and target recognition XIII : 12-14 April 2004, Oriando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5429

発行年:

2004

開始ページ:

513

終了ページ:

521

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453525 [0819453528]

言語:

英語

請求記号:

P63600/5429

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013781
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Signal Processing, Sensor Fusion, and Target Recognition
回次:	13th
会議開催地:	Oriando, FL, USA
会議開催年:	2004.04.12-2004.04.14

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