Spectroscopic characterization of explosives in the far-infrared region
- 著者名:
Chen, Y. ( Rensselaer Polytechnic Institute (USA) ) Liu, H. ( Rensselaer Polytechnic Institute (USA) ) Deng, Y. ( Rensselaer Polytechnic Institute (USA) ) Veksler, D.B. ( Rensselaer Polytechnic Institute (USA) ) Shur, M.S. ( Rensselaer Polytechnic Institute (USA) ) Zhang, X.-C. ( Rensselaer Polytechnic Institute (USA) ) Schauki, D. ( Johns Hopkins Univ. (USA) ) Fitch, M.J. ( Johns Hopkins Univ. (USA) ) Osiander, R. ( Johns Hopkins Univ. (USA) ) Dodson, C. ( Johns Hopkins Univ. (USA) ) Spicer, J.B. ( Johns Hopkins Univ. (USA) ) - 掲載資料名:
- Terahertz for military and security applications II : 12-13 April 2004, Orlando, Florida, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5411
- 発行年:
- 2004
- 開始ページ:
- 1
- 終了ページ:
- 8
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453341 [081945334X]
- 言語:
- 英語
- 請求記号:
- P63600/5411
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
ESA Publications Division |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |