Characterization of quantum well laser diodes for application within the AMRDEC HWIL facilities

Characterization of quantum well laser diodes for application within the AMRDEC HWIL facilities

著者名:

Saylor, D.A. ( Optical Sciences Corp. (USA) )
Bender, M. ( Optical Sciences Corp. (USA) )
Cantey, T.M. ( Optical Sciences Corp. (USA) )
Beasley, D.B. ( Optical Sciences Corp. (USA) )
Buford, J.A. ( U.S. Army Aviation and Missile Command (USA) )

掲載資料名:

Technologies for synthetic environments: hardware-in-the-loop testing IX : 13-14 April 2004, Oriando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5408

発行年:

2004

開始ページ:

144

終了ページ:

154

総ページ数:

11

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453310 [0819453315]

言語:

英語

請求記号:

P63600/5408

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013762
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Technologies for Synthetic Environments
回次:	2004 : 9th
会議開催地:	Oriando, FL, USA
会議開催年:	2004.04.13-2004.04.14

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