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Two-color HgCdTe focal plane detector simulation

著者名:
  • Sanders, T.J. ( Advanced Engineering Technology, Inc. (USA) )
  • Hess, G.T. ( Advanced Engineering Technology, Inc. (USA) )
  • Eisert, S. ( Advanced Engineering Technology, Inc. (USA) )
掲載資料名:
Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5407
発行年:
2004
開始ページ:
181
終了ページ:
188
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453303 [0819453307]
言語:
英語
請求記号:
P63600/5407
資料種別:
国際会議録

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