Microcontroller signal density stress prediction framework
- 著者名:
- Hsieh, S.-J. ( Texas A&M Univ. (USA) )
- Huang, S.-L. ( Texas A&M Univ. (USA) )
- Chang, S.-C. ( Texas A&M Univ. (USA) )
- 掲載資料名:
- Thermosense XXVI
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5405
- 発行年:
- 2004
- 開始ページ:
- 476
- 終了ページ:
- 486
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453280 [0819453285]
- 言語:
- 英語
- 請求記号:
- P63600/5405
- 資料種別:
- 国際会議録
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