Blank Cover Image

Design and test of a microfabricated SU-8 optical scanner

著者名:
掲載資料名:
Health monitoring and smart nondestructive evaluation of structural and biological systems III : 15-17 March 2004, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5394
発行年:
2004
開始ページ:
280
終了ページ:
287
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453112 [0819453110]
言語:
英語
請求記号:
P63600/5394
資料種別:
国際会議録

類似資料:

Wang, W.-C., Panergo, R.R., Reinhall, P.G.

SPIE-The International Society for Optical Engineering

H. Wang, W. Su, Z. Xing

Society of Photo-optical Instrumentation Engineers

Panergo, R., Liu, C. -S., Estroff, B., Wang, W. -C.

SPIE - The International Society of Optical Engineering

W. Wang, C. Huang, T. Chiang, P. G. Reinhall

SPIE - The International Society of Optical Engineering

Wang, W.-C., Panergo, R.R., Galvanin, C.M., Ledoux, W., Sangeorzan, B., Reinhall, P.G.

SPIE-The International Society for Optical Engineering

Xiong,X., Zou,Q., Lu,D., Wang,W.

SPIE-The International Society for Optical Engineering

Huang, C. -Y., Liu, C. -S., Panergo, R., Huang, C. -S., Wang, W. -C.

SPIE - The International Society of Optical Engineering

Su,G.-D.J., Patterson,P.R., Wu,M.C.

SPIE-The International Society for Optical Engineering

S. Kurth, C. Kaufmann, R. Hahn, J. Mehner, W. Doetzel, T. Gessner

SPIE - The International Society of Optical Engineering

Hoffman, R.R., Singleton, A., Walker, G,. R

SPIE - The International Society of Optical Engineering

Wang, W.-C., Fauver, M., Ho, J.N., Seibel, E.J., Reinhall, P.G.

SPIE-The International Society for Optical Engineering

G.H. Bhatia, K.E. Smith, P.K. Commean, J.J. Whitestone, M.W. Vannier

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12