Barkhausen noise and eddy current microscopy: a new scanning probe technique for microscale characterization of materials

Barkhausen noise and eddy current microscopy: a new scanning probe technique for microscale characterization of materials

著者名:

Szielasko, K. ( Fraunhofer-Institut fur Zerstoerungsfreie Pruefverfahren (Germany) )
Lugin, S. ( Fraunhofer-Institut fur Zerstoerungsfreie Pruefverfahren (Germany) )
Kopp, M. ( Fraunhofer-Institut fur Zerstoerungsfreie Pruefverfahren (Germany) )
Alpeter, I. ( Fraunhofer-Institut fur Zerstoerungsfreie Pruefverfahren (Germany) )

掲載資料名:

Testing, Reliability, and Application of Micro- and Nano-Material Systems II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5392

発行年:

2004

開始ページ:

105

終了ページ:

113

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453099 [0819453099]

言語:

英語

請求記号:

P63600/5392

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013744
シリーズID:	PA00000029
会議名:	Smart Structures : Testing, Reliability, and Application of Micro-and Nano-Material Systems
回次:	2004 : 2nd
会議開催地:	San Diego, CA, USA
会議開催年:	2004.03.15-2004.03.17

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