Interface transferring mechanism and error modification of embedded FBG strain sensor

Interface transferring mechanism and error modification of embedded FBG strain sensor

著者名:

Li, J. ( Harbin Institute of Technology (China) )
Zhou, Z. ( Harbin Institute of Technology (China) )
Ou, J. ( Harbin Institute of Technology (China) )

掲載資料名:

Smart structures and materials 2004 : smart sensor technology and measurement systems : 15-17 March 2004, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5384

発行年:

2004

開始ページ:

190

終了ページ:

198

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453013 [0819453013]

言語:

英語

請求記号:

P63600/5384

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013736
シリーズID:	PA00000029
会議名:	Smart Structures and Materials
回次:	2004
会議開催地:	San Diego, CA, USA
会議開催年:	2004.03.15-2004.03.17

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