Taking the X Architecture to the 65-nm technology node
- 著者名:
Sarma, R.C. ( Cadence Design Systems, Inc. (USA) ) Smayling, M.C. ( Applied Materials, Inc. (USA) ) Arora, N. ( Cadence Design Systems, Inc. (USA) ) Nagata, T. ( Applied Materials, Inc. (USA) ) Duane, M.P. ( Applied Materials, Inc. (USA) ) Shah, S. ( Cadence Design Systems, Inc. (USA) ) Keston, H.J. ( Applied Materials, Inc. (USA) ) Oemardani, S. ( Applied Materials, Inc. (USA) ) - 掲載資料名:
- Design and process integration for microelectronic manufacturing II [sic] : 26-27 February 2004, Santa Clara, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5379
- 発行年:
- 2004
- 開始ページ:
- 47
- 終了ページ:
- 54
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819452924 [0819452920]
- 言語:
- 英語
- 請求記号:
- P63600/5379
- 資料種別:
- 国際会議録
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