Reliability of oxide VCSELs at Emcore

Reliability of oxide VCSELs at Emcore

著者名:

Helms, C.J. ( EMCORE Corp. (USA) )
Aeby, I. ( EMCORE Corp. (USA) )
Luo, W. ( EMCORE Corp. (USA) )
Herrick, R.W. ( EMCORE Corp. (USA) )
Yuen, A. ( EMCORE Corp. (USA) )

掲載資料名:

Vertical-Cavity Surface-Emitting Lasers VIII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5364

発行年:

2004

開始ページ:

183

終了ページ:

189

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819452726 [0819452726]

言語:

英語

請求記号:

P63600/5364

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013708
シリーズID:	PA00000029
会議名:	Photonics West - Optoelectronic Materials and Devices : Vertical-Cavity Surface-Emitting Lasers
回次:	2004 : 8th
会議開催地:	San Jose, CA, USA
会議開催年:	2004.01.28-2004.01.29

類似資料:

1 国際会議録 Oxide VCSEL reliability qualification at Agilent Technologies Herrick, R.W. SPIE-The International Society for Optical Engineering	7 国際会議録 Reliability and failure mechanisms of oxide VCSELs in non-hermetic enviroments Xie, S., Herrick, R.W., Brabander, G.N.D., Widjaja, W.H., Koelle, U., Cheng, A.-N., Giovane, L.M., Hu, F.Z., Keever, … SPIE-The International Society for Optical Engineering
2 国際会議録 Production of high-speed oxide-confined VCSEL arrays for datacom applications (Invited Paper) Bossert, D.J., Collins, D., Aeby, I., Clevenger, J.B., Helms, C.J., Luo, W., Wang, C.X., Hou, H.Q. SPIE-The International Society for Optical Engineering	8 国際会議録 Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies Herrick,R.W., Lim,S.F., Deng,H., Deng,Q., Dudley,J.J., Keever,M.R., Oh,T., Li,M.Y., Tashima,M., Hodge,L.A., Zhang,X., … SPIE - The International Society for Optical Engineering
3 国際会議録 Highly reliable oxide VCSELs for datacom applications (Invited Paper) Aeby, I., Collins, D., Gibson, B., Helms, C.J., Hou, H.Q., Lou, W., Bossert, D.J., Wang, C.X. SPIE-The International Society for Optical Engineering	9 国際会議録 Analysis of VCSEL degradation modes Herrick,R.W., Cheng,Y.M., Beck,J.M., Petroff,P.M., Scott,J.W., Peters,M.G., Robinson,G.D., Coldren,L.A., Morgan,R.A., … SPIE-The International Society for Optical Engineering
4 国際会議録 Design and manufacturing of 10G GenX VCSELs at Emcore N. Li, D. Collins, S. Jatar, O. Lavrova, C. Helms, W. Luo, L. Liu, C. Liu, M. Qiu, K. Roff, C. Wang, C. Yang, H. Chiou SPIE - The International Society of Optical Engineering	10 国際会議録 Reliability of vertical-cavity lasers at Hewlett-Packard Herrick,R.W., Lei,C., Keever,M.R., Lim,S.F., Deng,H., Dudley,J.J., Bhagat,J.K. SPIE - The International Society for Optical Engineering
5 国際会議録 Characterization of failure mechanisms for oxide VCSELs (Invited Paper) McHugo, S.A., Krishnan, A., Krueger, J.J., Luo, Y., Tan, N.-X., Osentowski, T., Xie, S., Mayonte, M.S., Herrick, R.W., … SPIE-The International Society for Optical Engineering	11 国際会議録 Electrically pumped directly modulated 1550-nm tunable VCSELs (Invited Paper) Sun, D., Kner, P., Boucart, J., Stone, R.J., Kageyama, T., Nabiev, R.F., Yuen, W., Jansen, M., Chang-Hasnain, C.J. SPIE-The International Society for Optical Engineering
6 国際会議録 850-nm oxide VCSEL development at Hewlett-Packard Deng,H., Dudley,J.J., Lim,S.F., Lei,C., Liang,B., Tashima,M., Hodge,L.A., Zhang,X., Herniman,J., Herrick,R.W. SPIE - The International Society for Optical Engineering	12 国際会議録 New Method to Characterize Thin Oxide Reliability Lin, Heng-Chih, Snyder, J. P., Helms, C. R. MRS - Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12