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Stress-induced birefringence in silicon-on-insulator (SOI) waveguides

著者名:
Ye, W.N. ( Carleton Univ. (Canada) and National Research Council of Canada (Canada) )
Xu, D.-X. ( National Research Council (Canada) )
Janz, S. ( National Research Council (Canada) )
Cheben, P. ( National Research Council (Canada) )
Delage, A. ( National Research Council (Canada) )
Picard, M.-J. ( National Research Council (Canada) )
Lamontagne, B. ( National Research Council (Canada) )
Tarr, N.G. ( Carleton Univ. (Canada) )
さらに 3 件
掲載資料名:
Optoelectronic Integration on Silicon
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5357
発行年:
2004
開始ページ:
57
終了ページ:
66
総ページ数:
10
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452658 [0819452653]
言語:
英語
請求記号:
P63600/5357
資料種別:
国際会議録

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