Improved measurement-based modeling of inverted-MSM photodetectors using on-wafer calibration structures
- 著者名:
- Cha, C. ( Georgia Institute of Technology (USA) )
- Kim, J.H. ( Georgia Institute of Technology (USA) )
- Huang, Z. ( Georgia Institute of Technology (USA) )
- Jokerst, N.M. ( Duke Univ. (USA) )
- Brooke, M.A. ( Duke Univ. (USA) )
- 掲載資料名:
- Semiconductor photodetectors : 28-29 January 2004, San Jose, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5353
- 発行年:
- 2004
- 開始ページ:
- 89
- 終了ページ:
- 96
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819452610 [0819452610]
- 言語:
- 英語
- 請求記号:
- P63600/5353
- 資料種別:
- 国際会議録
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