Wafer-level scale package of MEMS device by eutectic bonding method
- 著者名:
Chen, S. ( Huazhong Univ. of Science and Technology (China) ) Ma, H. ( Huazhong Univ. of Science and Technology (China) ) Chen, M. ( Huazhong Univ. of Science and Technology (China) ) Xiong, T. ( Huazhong Univ. of Science and Technology (China) ) Liu, S. ( Huazhong Univ. of Science and Technology (China) ) Yi, X. ( Huazhong Univ. of Science and Technology (China) ) - 掲載資料名:
- Reliability, Testing, and Characterization of MEMS/MOEMS III
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5343
- 発行年:
- 2004
- 開始ページ:
- 94
- 終了ページ:
- 100
- 総ページ数:
- 7
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819452511 [0819452513]
- 言語:
- 英語
- 請求記号:
- P63600/5343
- 資料種別:
- 国際会議録
類似資料:
American Society of Mechanical Engineers |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society | |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |