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Wafer-level scale package of MEMS device by eutectic bonding method

著者名:
Chen, S. ( Huazhong Univ. of Science and Technology (China) )
Ma, H. ( Huazhong Univ. of Science and Technology (China) )
Chen, M. ( Huazhong Univ. of Science and Technology (China) )
Xiong, T. ( Huazhong Univ. of Science and Technology (China) )
Liu, S. ( Huazhong Univ. of Science and Technology (China) )
Yi, X. ( Huazhong Univ. of Science and Technology (China) )
さらに 1 件
掲載資料名:
Reliability, Testing, and Characterization of MEMS/MOEMS III
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5343
発行年:
2004
開始ページ:
94
終了ページ:
100
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452511 [0819452513]
言語:
英語
請求記号:
P63600/5343
資料種別:
国際会議録

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