Blank Cover Image

Segmentation and classification of four common cotton contaminants in x-ray microtomographic images

著者名:
掲載資料名:
Machine Vision Applications in Industrial Inspection XII
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5303
発行年:
2004
開始ページ:
1
終了ページ:
13
総ページ数:
13
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452061 [0819452068]
言語:
英語
請求記号:
P63600/5303
資料種別:
国際会議録

類似資料:

1 国際会議録 Cotton trash assessment in radiographic x-ray images with scale-space filtering and stereo analysis

Dogan, M. S., Sari-Sarraf, H., Hequet, E. F.

SPIE - The International Society of Optical Engineering
7 国際会議録 Image-processing algorithm for automatic assessment of fabric shrinkage

Sari-Sarraf, H., Hequet, E. F., Abidi, N., Dai, Y., Chan, H. Y., Jasso, M. R., Morris, B.

SPIE-The International Society for Optical Engineering
2 国際会議録 Statistical modeling, detection, and segmentation of stains in digitized fabric images

A. Gururajan, H. Sari-Sarraf, E. F. Hequet

SPIE - The International Society of Optical Engineering
8 国際会議録 Hierarchical segmentation of vertebrae from x-ray images

Zamora, G., Sari-Sarraf, H., Long, L.R.

SPIE-The International Society for Optical Engineering
3 国際会議録 Preliminary validation of a fabric smoothness assessment system

Turner, C., Sari-Sarraf, H., Hequet, E.F., Lee, S.

SPIE-The International Society for Optical Engineering
9 国際会議録 Impact of intensity edge map on segmentation of noisy range images

Zhang,Y., Sun,Y., Sari-Sarraf,H., Abidi,M.A.

SPIE - The International Society for Optical Engineering
4 国際会議録 A general approach to defect detection in textured materials using a wavelet domain model and level sets [6001-13]

Chan, H.-Y., Raju, C., Sari-sarraf, H., Hequet, E.F.

SPIE - The International Society of Optical Engineering
10 国際会議録 Automatic screening of polycystic kidney disease in x-ray CT images of laboratory mice

Gleason,S.S., Sari-Sarraf,H., Paulus,M.J., Johnson,D.K., Abidi,M.A.

SPIE - The International Society for Optical Engineering
5 国際会議録 Fabric smoothness evaluation using the wavelet domain independent mixture model and a landform classification technique

Turner, C., Chan, H. Y., Sari-Sarraf, H., Hequet, E. F.

SPIE - The International Society of Optical Engineering
11 国際会議録 Analysis of the feasibility of using active shape models for segmentation of gray-scale images

Zamora, G., Sari-Sarraf, H., Mitra, S., Long, L.R.

SPIE-The International Society for Optical Engineering
6 国際会議録 Accurate length measurement of multiple cotton fibers

H. Wang, C. Mao, H. Sari-Sarraf, E. Hequet

SPIE - The International Society of Optical Engineering
12 国際会議録 Image paradigm for semiconductor defect data reduction

Tobin,K.W., Gleason,S.S., Karnowski,T.P., Sari-Sarraf,H., Bennett,M.H.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12