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Two-phase full-frame CCD with double ITO gate structure for increased sensitivity

著者名:
Des Jardin, W. ( Eastman Kodak Co. (USA) )
Kosman, S. ( Eastman Kodak Co. (USA) )
Kurfiss, N. ( Eastman Kodak Co. (USA) )
Johnson, J. ( Eastman Kodak Co. (USA) )
Losee, D. ( Eastman Kodak Co. (USA) )
Putnam, G.G. ( Eastman Kodak Co. (USA) )
Tanbakuchi, A. ( Eastman Kodak Co. (USA) )
さらに 2 件
掲載資料名:
Sensors and camera systems for scientific, industrial, and digital photography applications V : 19-21 January, 2004, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5301
発行年:
2004
開始ページ:
59
終了ページ:
66
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452047 [0819452041]
言語:
英語
請求記号:
P63600/5301
資料種別:
国際会議録

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