The effects of vacuum baking on the I-V characteristics of LWIR HgCdTe photodiodes
- 著者名:
- Nguyen, T.H. ( Univ. of Western Australia (Australia) )
- Musca, C.A. ( Univ. of Western Australia (Australia) )
- Dell, J.M. ( Univ. of Western Australia (Australia) )
- Antoszewski, J. ( Univ. of Western Australia (Australia) )
- Faraone, L. ( Univ. of Western Australia (Australia) )
- 掲載資料名:
- Microelectronics: Design, Technology, and Packaging
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5274
- 発行年:
- 2004
- 開始ページ:
- 433
- 終了ページ:
- 441
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451675 [0819451673]
- 言語:
- 英語
- 請求記号:
- P63600/5274
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
RIE-induced n-on-p junction HgCdTe photodiodes: effects of passivant technology on bake stability
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
国際会議録
Laser-beam-induced current technique as a quantitative tool for HgCdTe photodiode characterization
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |