Absolute testing of aspheric surfaces
- 著者名:
- Reichelt, S. ( Univ. Stuttgart (Germany) )
- Pruss, C. ( Univ. Stuttgart (Germany) )
- Tiziani, H.J. ( Univ. Stuttgart (Germany) )
- 掲載資料名:
- Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5252
- 発行年:
- 2004
- 開始ページ:
- 252
- 終了ページ:
- 263
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451361 [0819451363]
- 言語:
- 英語
- 請求記号:
- P63600/5252
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
7
国際会議録
Self-calibration of wavefront testing interferometers by use of diffractive elements [6292-05]
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE--International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |