n/t measurements of sol-gel ZrO2 thin films

n/t measurements of sol-gel ZrO2 thin films

著者名:

Elalamy, Z. ( Institut Fresnel, CNRS-ENSPM (France) )

Drouard, E. ( Institut Fresnel, CNRS-ENSPM (France) )

Escoubas, L. ( Institut Fresnel, CNRS-ENSPM (France) )

Flory, F. ( Institut Fresnel, CNRS-ENSPM (France) )

McGovern, T. ( Institut Fresnel, CNRS-ENSPM (France) )

Simon, J.-J. ( Institut Fresnel, CNRS-ENSPM (France) )

さらに 1 件

掲載資料名:

Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5250

発行年:

2004

開始ページ:

278

終了ページ:

285

総ページ数:

8

出版情報:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451347 [0819451347]

言語:

英語

請求記号:

P63600/5250

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013595
シリーズID:	PA00000029
会議名:	SPIE Optical Systems Design : Advances in optical thin films
回次:	2003
会議開催地:	St. Etienne, France
会議開催年:	2003.09.30-2003.10.03

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