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Study on active probe laser system used for laser plasma diagnostic

著者名:
Yuan, X. ( Tsinghua Univ. (China) and China Academy of Engineering Physics (China) )
Wei, X. ( China Academy of Engineering Physics (China) )
Wang, C. ( China Academy of Engineering Physics (China) )
Qing, X. ( China Academy of Engineering Physics (China) )
Deng, W. ( China Academy of Engineering Physics (China) )
Xu, B. ( China Academy of Engineering Physics (China) )
Jiang, D. ( China Academy of Engineering Physics (China) )
Tang, J. ( China Academy of Engineering Physics (China) )
Jia, H. ( China Academy of Engineering Physics (China) )
さらに 4 件
掲載資料名:
ECLIM 2002 : 27th European Conference on Laser Interaction with Matter : 7-11 October 2002, Moscow, Russia
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5228
発行年:
2003
開始ページ:
621
終了ページ:
628
総ページ数:
8
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451019 [0819451010]
言語:
英語
請求記号:
P63600/5228
資料種別:
国際会議録

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