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Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element

著者名:
  • Mihaylova, E.M. ( Dublin Institute of Technology (Ireland) )
  • Toal, V. ( Dublin Institute of Technology (Ireland) )
  • Guntaka, S.R. ( Dublin Institute of Technology (Ireland) )
  • Martin, S. ( Dublin Institute of Technology (Ireland) )
掲載資料名:
12th International School on Quantum Electronics: Laser Physics and Applications
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5226
発行年:
2003
開始ページ:
209
終了ページ:
213
総ページ数:
5
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450999 [0819450995]
言語:
英語
請求記号:
P63600/5226
資料種別:
国際会議録

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