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Deducing light scatter from AFM measurements

著者名:
  • Hahlweg, C. ( Univ. der Bundeswehr Hamburg (Germany) )
  • Rinder, T. ( Univ. der Bundeswehr Hamburg (Germany) )
  • Thomsen-Schmidt, P. ( Physikalisch-Technische Bundesanstalt (Germany) )
  • Groh, C. ( Univ. der Bundeswehr Hamburg (Germany) )
  • Rothe, H. ( Univ. der Bundeswehr Hamburg (Germany) )
掲載資料名:
Surface scattering and diffraction III : 4-6 August 2003, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5189
発行年:
2003
開始ページ:
108
終了ページ:
115
総ページ数:
8
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450623 [0819450626]
言語:
英語
請求記号:
P63600/5189
資料種別:
国際会議録

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