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Reliable determination of wavelength dependence of thin film refractive index

著者名:
Tikhonravov, A.V. ( Moscow State Univ. (Russia) )
Trubetskov, M.K. ( Moscow State Univ. (Russia) )
Amotchkina, T.V. ( Moscow State Univ. (Russia) )
Tikhonravov, A.A. ( Moscow State Univ. (Russia) )
Ristau, D. ( Laser Zentrum Hannover e.V. (Germany) )
Gunster, S. ( Laser Zentrum Hannover e.V. (Germany) )
さらに 1 件
掲載資料名:
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5188
発行年:
2003
開始ページ:
331
終了ページ:
342
総ページ数:
12
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450616 [0819450618]
言語:
英語
請求記号:
P63600/5188
資料種別:
国際会議録

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