Surface characterization of optically polished CaF2 crystal by quasi-Brewster angle technique

Surface characterization of optically polished CaF2 crystal by quasi-Brewster angle technique

著者名:

Wang, J. ( Corning Tropel Corp. (USA) )
Maier, R.L. ( Corning Tropel Corp. (USA) )
Bruning, J.H. ( Corning Tropel Corp. (USA) )

掲載資料名:

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5188

発行年:

2003

開始ページ:

106

終了ページ:

114

総ページ数:

9

出版情報:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819450616 [0819450618]

言語:

英語

請求記号:

P63600/5188

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013559
シリーズID:	PA00000029
会議名:	Optics & Photonics : Advanced characterization techniques for optics, semiconductors, and nanotechnologies
回次:	2003
会議開催地:	San Diego, CA, USA
会議開催年:	2003.08.03-2003.08.05

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