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Optical characterization in wide spectral range by a coherent spectrophotometer

著者名:
Sirutkaitis, V. ( Vilnius Univ. (Lithuania) )
Eckardt, R.C. ( Cleveland Crystals, Inc. (USA) )
Balachninaite, O. ( Vilnius Univ. (Lithuania) )
Grigonis, R. ( Vilnius Univ. (Lithuania) )
Melninkaitis, A. ( Vilnius Univ. (Lithuania) )
Rakickas, T. ( Vilnius Univ. (Lithuania) )
さらに 1 件
掲載資料名:
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5188
発行年:
2003
開始ページ:
19
終了ページ:
34
総ページ数:
16
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450616 [0819450618]
言語:
英語
請求記号:
P63600/5188
資料種別:
国際会議録

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