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Precise free spectral range measurement of telecom etalons

著者名:
掲載資料名:
Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5180
発行年:
2003
開始ページ:
274
終了ページ:
282
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450531 [0819450537]
言語:
英語
請求記号:
P63600/5180
資料種別:
国際会議録

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