An overview of radiation single event effects testing of advanced memory components

An overview of radiation single event effects testing of advanced memory components

著者名:: Harboe-Sorensen, R. ( ESA/ESTEC, Noordwijk, the Netherlands )
掲載資料名:: Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France
シリーズ名:: ESA SP
シリーズ巻号:: 507
発行年:: 2002
開始ページ:: 239
終了ページ:: 246
総ページ数:: 8
出版情報:: Noordwijk, The Netherlands: ESA Publications Division
ISSN:: 03796566
ISBN:: 9789290928171 [9290928174]
言語:: 英語
請求記号:: E11690/507
資料種別:: 国際会議録

詳細

TDL書誌ID:	ZA00013503
シリーズID:	PA00000009
会議名:	European Space Components Conference : ESCCON 2002
回次:	2002
会議開催地:	Toulouse, France
会議開催年:	2002.09.24-2002.09.27

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