New Techniques for a Better Performance of Total Dose Radiation Tests over EEE Components

New Techniques for a Better Performance of Total Dose Radiation Tests over EEE Components

著者名:

Fenoy, S. ( Tecnologica SA, Spain )
Valverde, J.M. ( Tecnologica SA, Spain )
Muinoz, E. ( Tecnologica SA, Spain )
Fernandez, C. ( Tecnologica SA, Spain )

掲載資料名:

Proceedings, European Space Components Conference, ESCCON 2000, 21-23 March 2000, ESTEC, Noordwijk, the Netherlands

シリーズ名:

ESA SP

シリーズ巻号:

439

発行年:

2000

開始ページ:

361

終了ページ:

366

総ページ数:

6

出版情報:

Noordwijk, The Netherlands: ESA Publications Division

ISSN:

03796566

ISBN:

9789290927563 [9290927569]

言語:

英語

請求記号:

E11690/439

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013447
シリーズID:	PA00000009
会議名:	European Space Components Conference : ESCCON 2000
回次:	2000
会議開催地:	Noordwijk, The Netherlands
会議開催年:	2000.03.21-2000.03.23

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