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Three-Dimensional Micron-Resolution X-Ray Laue Diffraction Measurement of Thermal Grain-Evolution in Aluminum

著者名:
Budai, J.D.
Yang, W.
Larson, B.C.
Tischler, J.Z.
Liu, W.
Weiland, H.
Ice, G.E.
さらに 2 件
掲載資料名:
Recrystallization and grain growth : SF2M : proceedings of the second Joint International Conference on Recrystallization and Grain Growth, ReX & GG2, SF2M, held in Annecy, France, 30th August - 3rd September 2004
シリーズ名:
Materials science forum
シリーズ巻号:
467-470
発行年:
2004
開始ページ:
1373
終了ページ:
1378
総ページ数:
6
出版情報:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499526 [0878499520]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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