Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe

Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe

著者名:

Staab, T.E.M.

掲載資料名:

Positron annihilation ICPA-13 : proceedings of the 13th International Conference on Positron Annihilation, Kyoto, Japan, September 2003

シリーズ名:

Materials science forum

シリーズ巻号:

445-446

発行年:

2004

開始ページ:

510

終了ページ:

512

総ページ数:

3

出版情報:

Uetikon-Zuerich: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878499366 [0878499369]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013357
シリーズID:	PA00000012
会議名:	ICPA : International Conference on Positron Annihilation
回次:	13th
会議開催地:	Kyoto, Japan
会議開催年:	2003.09.00

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