SiC X-Ray Detectors for Spectroscopy and Imaging over a Wide Temperature Range

SiC X-Ray Detectors for Spectroscopy and Imaging over a Wide Temperature Range

著者名:

Bertuccio, G.

掲載資料名:

Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden

シリーズ名:

Materials science forum

シリーズ巻号:

433-436

発行年:

2003

開始ページ:

941

終了ページ:

944

総ページ数:

4

出版情報:

Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878499205 [0878499202]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013351
シリーズID:	PA00000012
会議名:	ECSCRM : European Conference on Silicon Carbide and Related Materials
回次:	2002 : 4th
会議開催地:	Linköping, Sweden
会議開催年:	2002.09.02-2002.09.05

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3 国際会議録 DEFECTS INDUCED BY PROTONS AND ｦﾃ-RAYS IN SEMI-INSULATING GaAs DETECTORS Castaldini, A., Cavallini, A., Papa, C. del, Fuochi, G., Alietti, M., Canali, C., Nava, F., Paccagnella, A., Lanzieri, … MRS - Materials Research Society	9 国際会議録 Room-temperature x- and gamma-ray spectroscopy with silicon drift detectors Struder,L., Hartmann,R., Kemmer,S., Krause,N., Stotter,D., Lutz,G., Solc,P., Holl,P., Lechner,P., Leutenegger,P., … SPIE-The International Society for Optical Engineering
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6 国際会議録 Study of Ion Induced Damage in 4H-SiC Giudice, A. Lo, Olivero, P., Fizzotti, F., Manfredotti, C., Vittone, E., Bianco, S., Bertuccio, G., Casiraghi, R., … Trans Tech Publications	12 国際会議録 Comprehensive Hot Electron Assessment of Ku-Band AlGaAs/GaAs Power HFETs: Electrical Characterization, Accelerated Stress, and Simulation Dieci, D., Tomasi, T, Canali, C., Menozzi, R., Sozzi, G., Lanzieri, C. ESA Publications Division

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