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Native and Irradiation-Induced Defects in SiO2 Structures Studied by Positron Annihilation Techniques

著者名:
Rivera, A.
Montilla, I.
Alba Garcia, A.
Escobar Galindo, R.
Falub, C.V.
van Veen, A.
Schut, H.
de Nijs, J.M.M.
Balk, P.
さらに 4 件
掲載資料名:
Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany
シリーズ名:
Materials science forum
シリーズ巻号:
363-365
発行年:
2001
開始ページ:
64
終了ページ:
66
総ページ数:
3
出版情報:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498758 [0878498753]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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