Analytical evaluation and correction of port loss error in integrating sphere reflectometers

Analytical evaluation and correction of port loss error in integrating sphere reflectometers

著者名:

Prokhorov, A. V. ( National Institute of Standards and Technology (USA) )
Mekhontsev, S. N.
Hanssen, L. M.

掲載資料名:

Optical diagnostic methods for inorganic materials III : 6-7 August 2003, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5192

発行年:

2003

開始ページ:

69

終了ページ:

79

総ページ数:

11

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819450654 [0819450650]

言語:

英語

請求記号:

P63600/5192

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013153
シリーズID:	PA00000029
会議名:	Optics & Photonics : Optical Diagnostic Methods for Inorganic Materials
回次:	2003 : 3rd
会議開催地:	San Diego, CA, USA
会議開催年:	2003.08.06-2003.08.07

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