Blank Cover Image

High-speed temperature measurements using novel optical-fiber-based systems

著者名:
掲載資料名:
Microsystems Engineering: Metrology and Inspection III
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5145
発行年:
2003
開始ページ:
117
終了ページ:
127
総ページ数:
11
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819450159 [0819450154]
言語:
英語
請求記号:
P63600/5145
資料種別:
国際会議録

類似資料:

Zhang,H., Lalor,M.J., Burton,D.R.

SPIE-The International Society for Optical Engineering

Gdeisat, M.A., Burton, D.R., Lalor, M.J.

SPIE-The International Society for Optical Engineering

Skydan, O.A., Lalor, M.J., Burton, D.R.

SPIE-The International Society for Optical Engineering

Herraez,M.Arevalillo, Burton,D.R., Lalor,M.J., Clegg,D.B.

SPIE-The International Society for Optical Engineering

Zhang,H., Wu,F., Lalor,M.J., Burton,D.R.

SPIE - The International Society for Optical Engineering

Arevalillo Herraez,M., Clegg,D.B., Burton,D.R., Lalor,M.J.

SPIE-The International Society for Optical Engineering

Zhang,H., Lalor,M.J., Burton,D.R.

SPIE-The International Society for Optical Engineering

Xia,J., Wang,C.F., He,X.Y., Tu,S.D., Gong,J.M.

SPIE-The International Society for Optical Engineering

H. Mills, D.R. Burton, M.J. Lalor

Society of Photo-optical Instrumentation Engineers

Pierce, M.C., Park, B.H., Cense, B., Shishkov, M.S., Boer, J.F.

SPIE-The International Society for Optical Engineering

A. Z. Abid, M. A. Gdeisat, D. R. Burton, M. J. Lalor, H. S. Abdul-Rahman

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12