Transverse priority scanning and microscopy for high-resolution optical coherence tomography

Transverse priority scanning and microscopy for high-resolution optical coherence tomography

著者名:

Hsiung, P.-L. ( Massachusetts Institute of Technology (USA) )

Aguirre, A.D. ( Massachusetts Institute of Technology (USA) )

Ko, T.H. ( Massachusetts Institute of Technology (USA) )

Bourquin, S. ( Massachusetts Institute of Technology (USA) )

Schneider, K. ( Massachusetts Institute of Technology (USA) )

Hartl, I. ( Massachusetts Institute of Technology (USA) )

Fujimoto, J.G. ( Massachusetts Institute of Technology (USA) )

さらに 2 件

掲載資料名:

Optical coherence tomography and coherence techniques : 22-24 June 2003, Munich, Germany

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5140

発行年:

2003

開始ページ:

110

終了ページ:

112

総ページ数:

3

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

16057422

ISBN:

9780819450104 [0819450103]

言語:

英語

請求記号:

P63600/5140

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013127
シリーズID:	PA00000029
会議名:	European Conference on Biomedical Optics : Optical coherence tomography and coherence techniques
回次:	2003
会議開催地:	Munich, Germany
会議開催年:	2003.06.22-2003.06.24

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