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Polarization-sensitive dual-wavelength spectroscopic optical coherence tomography

著者名:
  • Royset, A. ( SINTEF Materials Technology (Norway) )
  • Storen, T. ( Norwegian Univ. of Science and Technology (Norway) )
  • Lokberg, O.J. ( Norwegian Univ. of Science and Technology (Norway) )
  • Lindmo, T. ( Norwegian Univ. of Science and Technology (Norway) )
掲載資料名:
Optical coherence tomography and coherence techniques : 22-24 June 2003, Munich, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5140
発行年:
2003
開始ページ:
87
終了ページ:
94
総ページ数:
8
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819450104 [0819450103]
言語:
英語
請求記号:
P63600/5140
資料種別:
国際会議録

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