Laplace transform photoinduced transient spectroscopy: a new powerful tool for defect characterization in semi-insulating materials

著者名:

• Pawlowski, M. ( Institute of Electronic Materials Technology (Poland) )
• Kaminski, P. ( Institute of Electronic Materials Technology (Poland) )
• Kozlowski, R. ( Institute of Electronic Materials Technology (Poland) )
• Miczuga, M. ( Military Univ. of Technology (Poland) )

掲載資料名:

Solid State Crystals 2002: Crystalline Materials for Optoelectronics

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5136

発行年:

2003

開始ページ:

59

終了ページ:

65

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819450043 [0819450049]

言語:

英語

請求記号:

P63600/5136

資料種別:

国際会議録