Low-frequency noise in AlGaAs/InGaAs/GaAs Hall micromagnetometers

Low-frequency noise in AlGaAs/InGaAs/GaAs Hall micromagnetometers

著者名:

Mosser, V. ( SchlumbergerSema (France) )
Jung, G. ( Ben-Gurion Univ. of the Negev (Israel) )
Przybytek, J. ( Univ. of Warsaw (Poland) )
Ocio, M. ( CEA Saclay (France) )
Haddab, Y. ( SchlumbergerSema (France) )

掲載資料名:

Noise and Information in Nanoelectronics, Sensors, and Standards

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5115

発行年:

2003

開始ページ:

183

終了ページ:

195

総ページ数:

13

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449757 [081944975X]

言語:

英語

請求記号:

P63600/5115

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013103
シリーズID:	PA00000029
会議名:	International Symposium on Fluctuations and Noise : Noise and Information in Nanoelectronics, Sensors, and Standards
回次:	2003
会議開催地:	Santa Fe, NM, USA
会議開催年:	2003.06.02-2003.06.04

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