High-frequency noise in FDSOI MOSFETs: a Monte Carlo investigation
- 著者名:
Rengel, R. ( Univ. de Salamanca (Spain) ) Mateos, J. ( Univ. de Salamanca (Spain) ) Pardo, D. ( Univ. de Salamanca (Spain) ) Gonzalez, T. ( Univ. de Salamanca (Spain) ) Martin, M.J. ( Univ. de Salamanca (Spain) ) Dambrine, G. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) ) Danneville, F. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) ) Raskin, J.-P. ( Univ. Catholique de Louvain (Belgium) ) - 掲載資料名:
- Noise in Devices and Circuits
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5113
- 発行年:
- 2003
- 開始ページ:
- 379
- 終了ページ:
- 386
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449733 [0819449733]
- 言語:
- 英語
- 請求記号:
- P63600/5113
- 資料種別:
- 国際会議録
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4
国際会議録
Impact of down scaling on high-frequency noise performance of bulk and SOI MOSFETs (Invited Paper)
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