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Characteristic potential method of noise calculation in semiconductor devices: calculation of 1/f noise in MOS transistors in the ohmic region (Invited Paper)

著者名:
  • Hong, S. ( Seoul National Univ. (South Korea) )
  • Kim, Y. ( Seoul National Univ. (South Korea) )
  • Min, H.S. ( Seoul National Univ. (South Korea) )
  • Park, Y.J. ( Seoul National Univ. (South Korea) )
掲載資料名:
Noise in Devices and Circuits
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5113
発行年:
2003
開始ページ:
267
終了ページ:
281
総ページ数:
15
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449733 [0819449733]
言語:
英語
請求記号:
P63600/5113
資料種別:
国際会議録

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