Computer simulation and reverse engineering of trap-assisted generation-recombination noise in advanced silicon MOSFETs (Invited Paper)
- 著者名:
- Bosman, G. ( Univ. of Florida (USA) )
- Hou, F.-C. ( Univ. of Florida (USA) )
- Martin, D.O. ( Univ. of Florida (USA) )
- Sanchez, J.E. ( Univ. of Florida (USA) )
- 掲載資料名:
- Noise in Devices and Circuits
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5113
- 発行年:
- 2003
- 開始ページ:
- 232
- 終了ページ:
- 236
- 総ページ数:
- 5
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449733 [0819449733]
- 言語:
- 英語
- 請求記号:
- P63600/5113
- 資料種別:
- 国際会議録
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