Effects of body biasing on the low-frequency noise of NMOSFETs from a 130-nm CMOS technology

Effects of body biasing on the low-frequency noise of NMOSFETs from a 130-nm CMOS technology

著者名:

Marin, M. ( STMicroelectronics (France) )
Deen, M.J. ( Univ. Montpellier II (France) )
de Murcia, M. ( Univ. Montpellier II (France) )
Llinares, P. ( STMicroelectronics (France) )
Vildeuil, J.C. ( STMicroelectronics (France) )

掲載資料名:

Noise in Devices and Circuits

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5113

発行年:

2003

開始ページ:

56

終了ページ:

65

総ページ数:

10

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449733 [0819449733]

言語:

英語

請求記号:

P63600/5113

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013101
シリーズID:	PA00000029
会議名:	International Symposium on Fluctuations and Noise : Noise in Devices and Circuits
回次:	2003
会議開催地:	Santa Fe, NM, USA
会議開催年:	2003.06.02-2003.06.04

類似資料:

1 国際会議録 Influence of the emitter-base junction depth on the low-frequency noise of Si/SiGeC heterojunction bipolar transistors Benoit, P., Chay, C., Delseny, C., Pascal, F., Llinares, P., Vildeuil, J.-C., Baudry, H. SPIE - The International Society of Optical Engineering	7 国際会議録 Low-frequency noise and random telegraph signal noise in SiGe:C heterojunction bipolar transistors: impact of carbon concentration J. Raoult, C. Delseny, F. Pascal, M. Marin, M. J. Deen SPIE - The International Society of Optical Engineering
2 国際会議録 The Effects of Low Temperature on the Static and Low Frequency Noise Characteristics of Double Barrier Resonant Tunneling Diodes M.J. Deen Electrochemical Society	8 国際会議録 Low-frequency noise behavior of polysilicon emitter bipolar junction transistors: a review (Keynote Address) Deen, M.J., Pascal, F. SPIE-The International Society for Optical Engineering
3 国際会議録 The Effects of AC and DC Reverse Bias Stress on the DC Forward Bias and Low Frequency Noise Characteristics of Polysilicon Emitter Bipolar Junction Transistors Doan, M.T., Buffet, Z., Deen, M.J. Electrochemical Society	9 国際会議録 Comparison of low-frequency noise in III-V and Si/SiGe HBTs (Invited Paper) Pascal, F., Guenard-Jarrix, S., Delseny, C., Penarier, A., Chay, C., Deen, M.J. SPIE-The International Society for Optical Engineering
4 国際会議録 Is SOI CMOS a promising technology for SOCs in high frequency range? Invited Raynaud, C., Gianesello, F., Tinella, C., Flatresse, P., Gwoziecki, R., Touret, P., Avenier, G., Haendler, S., Gonnard, … Electrochemical Society	10 国際会議録 Time-domain model for an avalanche photodiode at low-bias Das,N.R., Deen,M.J. SPIE-The International Society for Optical Engineering
5 国際会議録 Physical model for low-frequency noise in avalanche breakdown of PN junctions Marinov, O., Deen, M.J. SPIE-The International Society for Optical Engineering	11 国際会議録 Low Frequency Noise in CdSe Thin-Film Transistors Deen, M.J., Rumyantsev, S.L., Glick, I., Smozh, A., Westcott, M., Waechter, D. Electrochemical Society
6 国際会議録 Charge Pumping, Low Frequency Noise, And Floating Gate Characterization Techniques Of SiO2 Gate Insulators In MOSFETs Deen, M.J., Raychaudhuri, A. Electrochemical Society	12 国際会議録 RuMBa: a rule-model OPC for low MEEF 130-nm KrF lithography Hsu,S., Shi,X., Hsu,M., Corcoran,N.P., Chen,J.F., Desai,S., Sherrill,M.J., Tseng,Y.C., Chang,H.A., Kao,J.F., Tseng,A., … SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12