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Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors

著者名:
掲載資料名:
Noise in Devices and Circuits
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5113
発行年:
2003
開始ページ:
44
終了ページ:
55
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449733 [0819449733]
言語:
英語
請求記号:
P63600/5113
資料種別:
国際会議録

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