The quantum ultraviolet catastrophe and the noise of an ultrashort pulse mode-locked laser

The quantum ultraviolet catastrophe and the noise of an ultrashort pulse mode-locked laser

著者名:

Takushima, Y. ( Massachusetts Institute of Technology (USA) )
Haus, H.A. ( Massachusetts Institute of Technology (USA) )
Kartner, F.X. ( Massachusetts Institute of Technology (USA) )

掲載資料名:

Fluctuations and noise in photonics and quantum optics : 2-4 June, 2003, Santa Fe, New Mexico, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5111

発行年:

2003

開始ページ:

214

終了ページ:

225

総ページ数:

12

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449719 [0819449717]

言語:

英語

請求記号:

P63600/5111

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013099
シリーズID:	PA00000029
会議名:	International Symposium on Fluctuations and Noise : Fluctuations and noise in photonics and quantum optics
回次:	2003
会議開催地:	Santa Fe, NM, USA
会議開催年:	2003.06.02-2003.06.04

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2 国際会議録 Linewidth of mode combs of passively and actively mode-locked semiconductor laser diodes (Invited Paper) Takushima, Y., Sotobayashi, H., Grein, M. E., Ippen, E. P., Haus, H. A. SPIE - The International Society of Optical Engineering	8 国際会議録 Mode-locked quantum dot lasers for picosecond pulse generation Thompson, M.G., Tan, K.T., Marinelli, C., Williams, K.A., Sellin, R.L., Penty, R.V., White, I.H., Kuntz, M., Laemmlin, … SPIE - The International Society of Optical Engineering
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