Real-time system diagnosis with sensors of uncertain quality

Real-time system diagnosis with sensors of uncertain quality

著者名:

Erdinc, O. ( Univ. of Connecticut (USA) )
Raghavendra, C. ( Univ. of Connecticut (USA) )
Willett, P.K. ( Univ. of Connecticut (USA) )
Kirubarajan, T. ( McMaster Univ. (Canada) )

掲載資料名:

System Diagnosis and Prognosis: Security and Condition Monitoring Issues III

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5107

発行年:

2003

開始ページ:

129

終了ページ:

140

総ページ数:

12

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449672 [0819449679]

言語:

英語

請求記号:

P63600/5107

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013096
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : System Diagnosis and Prognosis
回次:	2003 : 3rd
会議開催地:	Orlando, FL, USA
会議開催年:	2003.04.21

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