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Analysis of characteristic parameters in nonideal shock wave data: wavelet thresholds

著者名:
  • Xu, Q. ( Nanjing Univ. of Science and Technology (China) )
  • Jin, C.
掲載資料名:
Independent Component Analyses, Wavelets, and Neural Networks
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5102
発行年:
2003
開始ページ:
354
終了ページ:
359
総ページ数:
6
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449627 [0819449628]
言語:
英語
請求記号:
P63600/5102
資料種別:
国際会議録

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