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Real-time IR/EO scene simulator (RISS) product improvements

著者名:
McKee, D.C. ( Northrop Grumman Amherst Systems (USA) )
Simmons, O.D.
Makar, R.J.
Nuwer, M.E.
Palumbo, P.W.
Schlossman, P.G.
Perry, R.C. ( Air Force Research Lab. (USA) )
Chan, L.
さらに 3 件
掲載資料名:
Technologies for synthetic environments: Hardware-in-the-loop testing VIII : 21-22 April 2003, Oriando, Florida, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5092
発行年:
2003
開始ページ:
259
終了ページ:
267
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449528 [0819449520]
言語:
英語
請求記号:
P63600/5092
資料種別:
国際会議録

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